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Low Noise Manual Probe Station High Stability Low Temperature Probe Station

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Low Noise Manual Probe Station High Stability Low Temperature Probe Station

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Model Number : ECH400V-EM

Place of Origin : Suzhou, China

Brand Name : GoGo

Certification : ISO 9001:2015 / ISO 14001:2015 / ISO 45001:2018

MOQ : 1

Payment Terms : T/T

Price : CNY 30000~600000/set

Packaging Details : Cardboard box + wooden box

Delivery Time : 30~60 work days

Supply Ability : 1set/day

Name : Probe Station

Cooling/Heating Method : Liquid nitrogen cooling,Resistance heating

Temperature Range : -190℃~400℃

Temperature Stability : ±0.1℃

Heating/Cooling Rate : Maximum Heating Rate:150℃/min,Maximum Cooling Rate:40℃/min

Sample Holder : Silver ;23mm*23mm

Optical Path : Reflection

Top Window Size : φ25mm*1mm

Window Material : JGS2 Fused Silica Glass (Transmission Range: 220 nm - 2500 nm), manually removable and replaceable.

Distance from Window Upper Surface to Sample Holder Upper Surface : 25mm

Chamber Height : 20.5mm

Probe : Gold-Plated Tungsten Carbide Coaxial Probes*4

Probe Adjustment : XYZ Travel: ±6mm

Probe Port : Triaxial BNC*4

Sample Stage Potential : Grounded or Electrically Floating

Chamber : Vacuum

Dimensions : 436mm*436mm*132mm

Net Weight : 13.5kg

Basic Configuration : TNEX*1、Externally Adjustable Probe Station*1、 Temperature controller*1、Cooling controller*1、Liquid Nitrogen Tank*1、Recirculating Chiller*1、Cables、Tubing、and Accessories

Optional : Adapter Plate/Customized Liquid Nitrogen Tank/Customized Recirculating Chiller/Vacuum System/Customized Probe/Customized Probe Port/Computer Host/ Customed Temperature Control Software

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Precision Cryogenic Probe Station with Manual Micrometer Adjustment XYZ ±6mm and Low-Noise Triaxial BNC Current Paths for -190℃ to 400℃

Product Name: GoGo ECH400V-EM Micrometer-Adjustable Cryogenic Probe Station for Low-Noise Device Characterization (-190℃ to 400℃)

Product Introduction

The GoGo ECH400V-EM is a high-stability, cryogenic Probe Station engineered for the most demanding electrical characterization of semiconductor devices and delicate materials. It delivers precise temperature control from -190℃ to 400℃ within a vacuum environment, essential for eliminating thermal drift and environmental contamination. This system distinguishes itself with a manual, micrometer-adjusted XYZ probe positioning mechanism, offering researchers tactile, sub-micron precision for establishing perfect electrical contacts. Combined with its low-noise triaxial BNC current paths, this Probe Station is the definitive solution for acquiring publication-grade electrical data on sensitive devices like photodetectors, advanced transistors, and quantum materials.

Key Advantages & Your Rationale for Selection
  • Tactile, Micrometer Precision Control: The manual XYZ micrometre adjustment (±6mm travel) provides unparalleled feel and stability for probe placement. This allows for exceptionally fine, drift-free positioning onto micron-scale device features, ensuring reliable and repeatable electrical contact.

  • Engineered for Signal Integrity: Featuring four gold-plated tungsten carbide coaxial probes connected via triaxial BNC ports, this Probe Station is built to minimize electromagnetic interference and leakage currents. This design is critical for accurate measurement of low-current and high-impedance devices.

  • Broad Thermal Testing Capability: Integrates efficient liquid nitrogen cooling with rapid resistive heating (150°C/min) to perform reliable device evaluation across nearly a 600°C temperature span, all with excellent ±0.1°C stability for trustworthy data.

  • Protected Vacuum Testing Environment: The sealed vacuum chamber safeguards air-sensitive samples (e.g., novel 2D materials, perovskites) from oxidation and prevents condensation during cryogenic operation, enabling true intrinsic property measurement.

  • Certified Build Quality & Centralized Workflow: Manufactured under ISO 9001:2015, 14001:2015, and 45001:2018 certified management systems. The integrated TNEX software provides complete digital command for automating complex temperature-electrical test sequences, enhancing productivity.

Technical Specifications
Parameter Specification
Model / Brand ECH400V-EM / GoGo
Core Function Low-Noise Electrical Testing in Vacuum at Variable Temperature
Probe Positioning Manual Micrometer Adjustment, XYZ ±6mm
Temperature Range -190℃ to 400℃
Temperature Stability ±0.1℃
Electrical Interface 4 x Triaxial BNC Ports
Chamber Environment Vacuum
Sample Viewing Top Reflection Window (φ25mm)
Control System TNEX Software Suite
Target Markets & Clients

This professional-grade Probe Station serves the advanced research and development sectors in key growth regions including Southeast Asia, the Middle East, Russia, and Africa. It is an essential instrument for university research groups, corporate R&D laboratories, and national measurement institutes focused on cutting-edge electronics and condensed matter physics.

Frequently Asked Questions (FAQ)
  1. Why choose a manually-adjusted Probe Station over a motorized one?
    Manual micrometer adjustment offers superior stability, zero electronic drift, and direct tactile feedback, which many researchers prefer for establishing the initial, critical contact with delicate or nanoscale devices, ensuring no accidental damage.

  2. What is the primary application of the triaxial BNC connections?
    Triaxial (triax) connections provide a guarded signal path to minimize noise and parasitic capacitance. This is indispensable for characterizing devices with ultra-low current levels (e.g., leakages in insulators, photocurrents) or making high-frequency measurements.

  3. Is this Probe Station suitable for testing perovskite solar cells or 2D materials?
    Absolutely. The vacuum environment prevents degradation of air-sensitive materials like perovskites. The precise manual probes and low-noise design are ideal for measuring the evolving electrical properties of these next-generation materials.

  4. What analytical instruments can be connected?
    The station's triaxial BNC ports are compatible with all major semiconductor parameter analyzers, source measure units (SMUs), and precision LCR meters, facilitating a complete device characterization setup.

  5. What is included for immediate operation?
    The system is supplied as a complete solution, including the main probe station with micrometre manipulators, dedicated temperature and cooling controllers, a liquid nitrogen tank, a recirculating chiller, TNEX software, and all necessary cables and accessories.


Product Tags:

Low Noise Manual Probe Station

      

Manual Probe Station High Stability

      

High Stability Low Temperature Probe Station

      
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